Atomically Flattened Surface Usefulness

Shigetoshi Sugawa from Tohoku University, Japan presented "Achievement, issues, and next steps of CMOS image sensors" at 6th International Workshop on Semiconductor Pixel Detectors for Particles and Imaging (PIXEL2012) held on September 3 – 7, 2012 in Inawashiro, Japan.

The presentation discusses pixel RTN limitations and improvements, HDR imaging with LOFIC, global shutter, fast frame rate, and more. One of the parts talks about atomically flattened surface advantages:

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